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Mobile applications with complex GUIs are very popular today. However, generating test cases for these applications is often tedious professional work. On the one hand, manually designing and writing elaborate GUI scripts requires expertise. On the other hand, generating GUI scripts with record and playback techniques usually depends on repetitive work that testers need to interact with the application...
Typically, oracles used to test graphical user interface(GUI) programs highly depend on environmental factors that are not related to the functionality of the program, such as screen resolution and color schemes. To accommodate these on-functional variations, researchers suggested fuzzy comparison rules that determine whether the output of a GUI program matches the oracles. Others suggested computer...
Analysis of activities in low-resolution videos or far fields is a research challenge which has not received much attention. In this application scenario, it is often the case that the motion of the objects in the scene is the only low-level information available, other features like shape or color being unreliable. Also, typical videos consist of interactions of multiple objects which pose a major...
This paper provides an overview of the requirements and capabilities of the UUT Explorer Test Program Set (TPS) utility application designed for use when testing Shop Replaceable Units (SRUs) on the Versatile Depot Automatic Test Station (VDATS). The requirement for creation of the UUT Explorer application was driven by a need to standardize the interface for the VDATS operators while simplifying...
This document presents a compilation of results from tests performed by iRoC Technologies on SER induced by alpha particles on SRAM memories for technology nodes from 180 nm to 65 nm. The aim of this study is to establish the variation of sensitivity with technology node for SEU and MCU, and to analyze the possible influence of different designs and technological parameters at a given technology node.
This paper studies the impact of intra-die random variability on low-power digital circuit designs, specifically, circuit timing failures due to intra-die variability. We identify a new low-Vdd statistical failure mode that is strongly supply-voltage dependent and also introduce a simple yet novel method for quantifying the effects of process variability on digital timing - a delay overlapping stage...
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