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IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 513 - 520
IEEE Transactions on Magnetics > 2016 > 52 > 7 > 1 - 4
IEEE Journal of Solid-State Circuits > 2015 > 50 > 12 > 2912 - 2921
IEEE Journal of Solid-State Circuits > 2014 > 49 > 3 > 708 - 717
IEEE Transactions on Instrumentation and Measurement > 2014 > 63 > 7 > 1748 - 1752
IEEE Access > 2013 > 1 > 16 - 28
IEEE Journal of Selected Topics in Quantum Electronics > 2013 > 19 > 2 > 359 - 368
IEEE Transactions on Power Electronics > 2011 > 26 > 10 > 2936 - 2945
IEEE Photonics Technology Letters > 2011 > 23 > 2 > 100 - 102
IEEE Transactions on Circuits and Systems I: Regular Papers > 2011 > 58 > 9 > 2061 - 2068
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2010 > 18 > 3 > 461 - 472
IEEE Transactions on Circuits and Systems I: Regular Papers > 2010 > 57 > 4 > 759 - 772
IEEE Microwave and Wireless Components Letters > 2010 > 20 > 2 > 85 - 87
IEEE Transactions on Circuits and Systems II: Express Briefs > 2010 > 57 > 5 > 348 - 352
IEEE Electron Device Letters > 2010 > 31 > 7 > 701 - 703
IEEE Photonics Technology Letters > 2009 > 21 > 20 > 1553 - 1555
IEEE Transactions on Instrumentation and Measurement > 2009 > 58 > 6 > 2008 - 2016
IEEE Journal of Solid-State Circuits > 2008 > 43 > 11 > 2482 - 2491
IEEE Transactions on Circuits and Systems I: Regular Papers > 2008 > 55 > 11 > 3373 - 3382