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IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2010 > 18 > 1 > 1 - 14
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 4 > 509 - 517
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2010 > 18 > 1 > 1 - 14
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 4 > 509 - 517