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Modern design for testability (DFT) techniques support the application of non-functional vectors with increased controllability, observability and ease of test generation complexity. High power demand due to excessive switching activity in test mode causes false failure, test escape and reliability issues. Therefore, generating power safe pattern test is an active research topic. Don't care bits present...
Near-Threshold Computing (NTC) shows potential to provide significant energy efficiency improvements as it alleviates the impact of leakage in modern deep sub-micron CMOS technology. As the gap between supply and threshold voltage shrink, however, the energy efficiency gains come at the cost of device performance variability. Thus, adopting near-threshold in modern CAD flows requires careful consideration...
Accurate mathematical models are crucial for design and evaluation of systems and architectures. To provide models that can accurately describe polynomial multipliers in F2[x], we integrate the traditional gate-counting method and the fanout four (FO4) model. We show that the resulting model provides much more accurate estimates than the traditional model and can be obtained by straight-forward modification...
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