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IEEE Electron Device Letters > 2011 > 32 > 1 > 96 - 98
IEEE Transactions on Instrumentation and Measurement > 2008 > 57 > 8 > 1572 - 1577
IEEE Electron Device Letters > 2011 > 32 > 1 > 96 - 98
IEEE Transactions on Instrumentation and Measurement > 2008 > 57 > 8 > 1572 - 1577