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Standard transmission line pulse (TLP) test system has been studied for evaluating ESD performance of semiconductor devices accurately. The impedance matching techniques in the standard transmission line pulse (TLP) test system can effectively eliminate the pulse waveform distortion, but increases the power attenuation. Thus the force imposed to the device under test is far less than the energy TLP...
The real part of gap impedance reflect the bandwidth of the coupled output cavities. Group delay time also have some relation with the bandwidth. In the simulation, group delay time can be taken as a basic reference, then field analysis method was used to calculate the real part of total gap impedance, thus plenty of time can be saved. We also test the group delay time characteristic using the vector...
In this paper, the new dual frequency DGS unit cell and its equivalent circuit model have been proposed. Model parameters extracting process was detailed and has been demonstrated its validity by experiment circuits. A significant improvement in effective capacitances is also illustrated. According to dual frequency DGS characteristics discussed in this paper, this newly proposed structure can be...
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