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Reliability and the mean lifetime are major aspects in today's semiconductor device manufacturing. The continuous downscaling of transistor sizes and power supplies are the root causes of higher vulnerabilities of integrated circuits against time zero process variation, time dependent degradation and random faults induced by environmental influences like particle strikes. Handling permanent faults...
In order to reduce test and repair cost in advanced system-on-chip products, wireless built-in self-repair (BISR) techniques for embedded memories are proposed in this paper. The redundant memory is divided into spare rows, spare column group blocks, and spare words which are used to replace faulty cells in the main memory. Based on this redundancy architecture, a BISR scheme suitable for built-in...
Built-in self test (BIST) and built-in self repair (BISR) techniques have been developed for memory blocks in recent years. Such techniques are suited to enhance production yield, but also to facilitate long-term dependable circuits though self repair in the field of application. BISR for logic circuits has shown to be much more complex, for which only a few approaches have been published so far....
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