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2015 IEEE International Reliability Physics Symposium > 5B.3.1 - 5B.3.6
IEEE Electron Device Letters > 2011 > 32 > 11 > 1585 - 1587
2015 IEEE International Reliability Physics Symposium > 5B.3.1 - 5B.3.6
IEEE Electron Device Letters > 2011 > 32 > 11 > 1585 - 1587