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Degradation by Joule heating of amorphous metal oxide thin-film transistors is one of the important issues for realizing next-generation displays. To clarify the self-heating degradation mechanism, it is indispensable to analyze the detailed temperature change of TFTs. In this study, we proposed a technique to suppress deterioration caused by self-heating in terms of driving methods, and investigated...
To date, light-emitting diode (LED) was often manufactured as multi package module instead of single package as for the luminosity demand and cost concern. Nevertheless, the uniformity of temperature gradient may generate unbalanced stress along the multi package interface, resulting in lifespan and output degradation. It is hence obligatory to predict and model the thermal transfer performance of...
A numerical procedure has been applied to analyze the temperature distribution in a rolling tire. A 3D finite element model of a rolling tire is established to simulate the mechanical field under the certain inflation pressure, loading and velocity condition. The thermal properties and loss factor of rubber are measured. The strain and the stress of nodes are fit by Fourier Series and are used to...
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