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Degradation by Joule heating of amorphous metal oxide thin-film transistors is one of the important issues for realizing next-generation displays. To clarify the self-heating degradation mechanism, it is indispensable to analyze the detailed temperature change of TFTs. In this study, we proposed a technique to suppress deterioration caused by self-heating in terms of driving methods, and investigated...
Cu/Co/Cu/NiFe multilayer films prepared by evaporation deposition in an ultrahigh vacuum were heat-treated in air and in ultrahigh vacuum. Heat treatment in ultra-high vacuum brought about no changes in the MR ratio or MR slope for annealing temperatures less than 400C. The thermal stability in air was limited by gradual oxidation from the surface, and thermal stability up to 250??C was verified....
The purpose of this research was to systematically evaluate the utility of thermal analysis techniques in lifetime prediction methods for electrical insulating materials. There have been studies using various separate thermal methods on electrical insulators but there appear to have been no reports where a variety of techniques were applied. Recently the terminology “total thermal analysis” has been...
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