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2011 International Reliability Physics Symposium > 2C.2.1 - 2C.2.10
IEEE Transactions on Plasma Science > 2011 > 39 > 1-1 > 18 - 21
2010 International Electron Devices Meeting > 35.2.1 - 35.2.4
IEEE Transactions on Microwave Theory and Techniques > 2010 > 58 > 9 > 2426 - 2433