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The sequential probability ratio test (SPRT) is the most common acceptance test in the field of reliability and quality control of electronic systems. Proposed are measures of the test quality. One of them is the increase in the average sample number (ASN) caused by the test truncation. An optimality criterion based on it considerably facilitates solution of the problems in automatic planning of the...
In this paper a BISR architecture for embedded memories is presented. The proposed scheme utilises a multiple bank cache-like memory for repairs. Statistical analysis is used for minimisation of the total resources required to achieve a very high fault coverage. Simulation results show that the proposed BISR scheme is characterised by high efficiency and low area overhead, even for high defect densities...
Electronic components are frequently connected in parallel as a measure to increase reliability. Whether the result of such a parallel connection results in an increase or a decrease in reliability, and the amount of such increase or decrease, is a function of the open-circuit failure probability and the short-circuit failure probability. Equations are derived which permit a determination of the increase...
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