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With the growing concerns about susceptibility of integrated circuits to electromagnetic interferences, the need for accurate prediction tools and models to reduce risks of non-compliance becomes critical for circuit designers. However, on-chip characterization of noise is still necessary for model validation. This paper presents an on-chip noise sensor dedicated to the time-domain measurement of...
This paper presents an experimental method that can be used to determine the cyclostationary properties of the low-frequency noise of bipolar transistors and diodes. The noise is measured while the device works in nonlinear regime, pumped by a low-noise signal source. To measure the noise around carrier (as close as 1 Hz offset from the carrier), bridge circuits are used to balance the pump out. By...
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