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In this paper, we present a new technique to improve the reliability of H-tree SRAM memories. This technique deals with the SRAM power-bus monitoring by using built-in current sensor (BICS) circuits that detect abnormal current dissipation in the memory power-bus. This abnormal current is the result of a single-event upset (SEU) in the memory and it is generated during the inversion of the state of...
This paper addresses the segmentation problem in noisy image based on Fast Edge Integration (FEI) method in active contour model (ACM) and proposes a new statistical active contour model (SACM). Two modifications are performed in FEI method. First, in order to handle noisy images, maximum log-likelihood estimation is used to replace the minimal variance term proposed by Chan and Vese. Second, a penalising...
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