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Multi-layered Al:ZnO thin films, with wurtzite - type structure and thickness up to 120 nm, as determined by x-ray diffraction and HRTEM, were grown on Si-SiO2 and glass substrates by the sol-gel method. Fluorescence spectroscopy measurements show that 0.5 at.% Al doping determines a blue shift of the emission band observed at 387nm in the undoped material. The room temperature conductivity increases...
BiFeO3-PbTiO3 (BFO-PT) thin films were fabricated by sol-gel technology. X-ray diffraction pattern reveals the BFO-PT films are in rhombohedral perovskite phase with random orientations. By Pt/BFO-PT/ITO/glass capacitor structure, co-measurement of electrical and optical responses can be achieved. Remanent polarization of 2Pr~40 muC.cm-2 and leakage current density of 2.5times10-5 A/cm2 at 100 kV/cm...
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