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Epitaxial Sr1 − xCaxRuO3 thin films were grown on SrTiO3 and LaAlO3 substrates with use of high pressure dc‐sputtering. A number of complementary methods: X‐ray diffraction (XRD), Rutherford backscattering (RBS), high resolution transmission electron microscopy (HRTEM), time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS), atomic force microscopy (AFM), and X‐ray photoemission spectroscopy (XPS)...
The structure of very thin iron silicides (d Fe <3Å) grown by solid phase epitaxy (SPE) on Si(111) is investigated by means of scanning tunnelling microscopy (STM) and low energy electron diffraction (LEED). A phase transformation, associated with a change in the surface periodicity, from a (2x2)-the usual surface reconstruction on metastable FeSi 2 layers-toward a c(4x8) periodicity...
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