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Memory is an integral and important component in most of the digital circuits. It is basically used for storing and retrieving data in many electronic circuits. In recent days, the soft errors affecting digital circuits have become the biggest challenge for memory applications. As technology is scaling down, the effect of single error upsets (SEUs) on memories further increased the concern on their...
Error correction codes (ECCs) have been used for decades to protect memories from soft errors. Single error correction (SEC) codes that can correct 1-bit error per word are a common option for memory protection. In some cases, SEC codes are extended to also provide double error detection and are known as SEC-DED codes. As technology scales, soft errors on registers also became a concern and, therefore,...
Soft errors caused by radiation particles are becoming an increasingly important issue for memory reliability. Traditionally, Single Error Correction (SEC) codes have been used to correct soft errors. Such codes can correct one error per memory word, but as errors become more frequent they may be insufficient. More complex error correction codes (ECCs) could be used, but they typically require complex...
We investigate atmospheric neutron effects on floating gate cells in MLC NAND Flash memories. Loss of information is shown to occur especially at the highest program levels, but to an extent that does not challenge current error correction capabilities. We discuss the physical mechanisms and analyze scaling trends, which show a rapid increase in sensitivity for decreasing feature size. A large spread...
We are developing a 32-bit embedded processor core with soft error detection and recovery mechanisms. Soft errors caused by atmospheric neutron hits or performance aging in an embedded processor core make the mission-critical embedded system to produce dangerous results like system failure. Our research goal is to investigate soft error rates in the proposed embedded processor core through fault injection...
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