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Due to reduction in device feature size and supply voltage, the sensitivity of digital systems to transient faults is increasing dramatically. As technology scales further, the increase in transistor integration capacity also leads to the increase in process and environmental variations. Despite these difficulties, it is expected that systems remain reliable while delivering the required performance...
This paper proposes a new approach to analyze crosstalk of coupled interconnects in the presence of process variations. The suggested method translates correlated process variations into orthogonal random variables by principle component analysis (PCA). combined with polynomial chaos expression (PCE), the technique utilizes Stochastic Collocation Method (SCM) to analyze the system response of coupled...
We present a generic method for analyzing the effect of process variability in nanoscale circuits. The proposed framework uses kernel and a generic tail probability estimator to eliminate the need for a-priori density choice for the nature of circuit variation. This allows capturing the true nature of the circuit variation from a few random samples of its observed responses. The data-driven, non-parametric,...
The dramatic increase in leakage current, coupled with the swell in process variability in nano-scaled CMOS technologies, has become a major issue for future IC design. Moreover, due to the spread of leakage power values, leakage variability cannot be neglected anymore. In this work an accurate analytic estimation and modeling methodology has been developed for logic gates leakage under statistical...
In this paper, we propose a probability-based algorithm to estimate full-chip leakage without knowing layout information, under intra-die and inter-die process variations. Through modeling process variations into a random vector, we show that the standard cell leakage can be modeled as an inverse Gaussian random variable and further demonstrate that full-chip leakage can also be approximated to be...
This paper is concerned with the estimation problem for discrete-time stochastic linear systems with multiple packet dropouts. Based on a recently developed model for multiple-packet dropouts, the original system is transferred to a stochastic parameter system by augmentation of the state and measurement. The optimal full-order linear filter of the form of employing the received outputs at the current...
Orthogonal frequency division multiplexing (OFDM) is the modulation scheme of choice for digital video broadcasting-handheld (DVB-H), which is required to operate under high mobility conditions resulting in significant Inter-carrier Interference (ICI). To mitigate ICI, several cancellation schemes have been proposed but they require reliable channel information at the receiver which is quite challenging...
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