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IEEE Transactions on Pattern Analysis and Machine Intelligence > 2017 > 39 > 6 > 1150 - 1164
2010 East-West Design&Test Symposium (EWDTS) > 326 - 327
2008 Congress on Image and Signal Processing > 2 > 23 - 28
IEEE Transactions on Pattern Analysis and Machine Intelligence > 2017 > 39 > 6 > 1150 - 1164
2010 East-West Design&Test Symposium (EWDTS) > 326 - 327
2008 Congress on Image and Signal Processing > 2 > 23 - 28