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IEEE Electron Device Letters > 2010 > 31 > 4 > 287 - 289
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 40 - 46
IEEE Electron Device Letters > 2010 > 31 > 7 > 656 - 658
IEEE Electron Device Letters > 2009 > 30 > 3 > 275 - 277
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 35 - 46