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Ion-implanted GaAs MESFET was modeled and dependences of MESFET characteristics on doping profile parameters were found. These dependences allow to optimize transistor for different applications (power, high frequency or low-noise transistors).
Ion-implanted GaAs MESFET was modeled and dependences of MESFET characteristics on doping profile parameters were found. These dependences allow to optimize transistor for different applications (power, high frequency or low-noise transistors).
Ion-implanted GaAs MESFET was modeled and dependence of MESFET characteristics on doping profile parameters was found. Dependence of transistors characteristics on doping profile parameters variation was investigated.
A novel lateral nonuniform doping technique, which is compatible with conventional ion implantation technology, is reported. GaAs MESFETs with a linear lateral doping channel have been fabricated and improvements in performance have been demonstrated.<<ETX>>
Field-effect transistors with channel doping profiles fabricated by the implantation of silicon ions into high-resistivity vapour phase epitaxial GaAs have given noise figures of 2.9 dB with an associated gain of approximately 5 dB at 10 GHz. Similar measurements on F.E.T.S fabricated in an identical manner, except for the channel fabrication, where silicon ions were implanted directly into a Cr-doped...
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