Search results
IEEE Design & Test > 2017 > 34 > 6 > 54 - 62
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 11 > 3255 - 3259
IEEE Micro > 2017 > 37 > 5 > 32 - 42
IEEE Transactions on Computers > 2017 > 66 > 6 > 982 - 995
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 59 - 68
IEEE Access > 2017 > 5 > 20785 - 20790
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 12 > 3489 - 3498
2016 International SoC Design Conference (ISOCC) > 101 - 102
IEEE Transactions on Nuclear Science > 2016 > 63 > 4-1 > 2129 - 2136
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 4 > 1280 - 1292
IEEE Transactions on Circuits and Systems I: Regular Papers > 2016 > 63 > 4 > 503 - 516