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The degradation of Ultra Low K (ULK) SiCOH dielectrics before breakdown is investigated. For the first time very early stages of degradation before breakdown have been revealed and a model of the basic process of ULK alteration process under electrical stress is proposed. Two different degradation patterns were found. Tip electrode test structures have been specifically designed for this investigation...
In our last paper, we have reported that due to the polarization properties of the plasticized polyvinyl chloride (PVC gels), the low energy ion irradiation made an internal negative charge accumulate on the gel surface near the anode. It then resulted in the creep deformation of PVC gel along the anode. In this paper, the small force generated by an applied electric field was measured by an innovative...
Space charge behavior has been investigated in LDPE/MgO composite films including the different size of MgO particles with a diameter of several tens nm (nano) or a few mum (micro) when a dc high stress is applied to the sample at high temperature. It is believed that a positive packet-like charge is injected from the anode, and after that a negative packet charge is injected from the cathode. In...
Continuous scaling, necessary for enhanced performance and cost reduction, has pushed existing CMOS materials much closer to their intrinsic reliability limits, forcing reliability engineers to get a better understanding of circuit failure. This requires that designers will have to be very careful with phenomena such as high current densities or voltage overshoots. In addition to the reliability issues,...
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