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IEEE Journal of the Electron Devices Society > 2016 > 4 > 5 > 205 - 214
IEEE Electron Device Letters > 2015 > 36 > 4 > 384 - 386
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 126 - 130
IEEE Journal of the Electron Devices Society > 2016 > 4 > 5 > 205 - 214
IEEE Electron Device Letters > 2015 > 36 > 4 > 384 - 386
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 126 - 130