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2011 International Reliability Physics Symposium > XT.8.1 - XT.8.6
IEEE Electron Device Letters > 2009 > 30 > 9 > 978 - 980
2011 International Reliability Physics Symposium > XT.8.1 - XT.8.6
IEEE Electron Device Letters > 2009 > 30 > 9 > 978 - 980