Search results
IEEE Journal of Solid-State Circuits > 2017 > 52 > 10 > 2769 - 2785
IEEE Transactions on Nuclear Science > 2017 > 64 > 6-1 > 1185 - 1190
IEEE Transactions on Reliability > 2011 > 60 > 3 > 528 - 537
2010 2nd International Conference on Computer Engineering and Technology > 4 > V4-420 - V4-423
Design Automation Conference > 693 - 698