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IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 219 - 226
IEEE Electron Device Letters > 2008 > 29 > 3 > 242 - 245
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 219 - 226
IEEE Electron Device Letters > 2008 > 29 > 3 > 242 - 245