The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Productivity gains resulting from larger wafers, smaller device features, and 90% and greater yields are now assumed. Hence, equipment utilization and manufacturing effectiveness have become targets for further improvement. Because productivity can be improved by access to additional equipment and factory data, ISMI's e-Manufacturing initiative has focused on data acquisition to enable factories to...
Pressure to increase semiconductor manufacturing productivity remains intense. Because productivity gains resulting from larger wafers, smaller device features, and 90% and greater yields are now assumed, equipment utilization and manufacturing effectiveness have become target areas for further improvement. IC makers believe that productivity can be improved significantly by additional equipment and...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.