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Microelectronics Reliability > 2015 > 55 > 9-10 > 1667-1671
Journal of Electronic Materials > 2010 > 39 > 5 > 478-481
IEEE Electron Device Letters > 2009 > 30 > 5 > 427 - 429
Microelectronics Reliability > 2015 > 55 > 9-10 > 1667-1671
Journal of Electronic Materials > 2010 > 39 > 5 > 478-481
IEEE Electron Device Letters > 2009 > 30 > 5 > 427 - 429