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Al x Ga 1−x Sb ternary solid solutions lattice-matched to the GaSb (001) substrate with composition in the range 0.05≤x≤0.2 were grown by liquid phase epitaxy. High resolution X-ray diffraction and Raman scattering techniques were applied to characterize Al x Ga 1−x Sb alloys. The out of plane lattice parameter was estimated directly from the asymmetrical diffractions...
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