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The microstructure and electromagnetic properties of FeCoB-SiO2 thin films which were deposited on different substrates (silicon, glass and Mylar) by using magnetron sputtering were studied. X-Ray Diffraction revealed that FeCo nanocrystalline only precipitated in FeCoB-SiO2 thin films on silicon and glass substrates, and the FeCoB-SiO2 films on Mylar substrate were amorphous. The surface images obtained...
In this paper nanocrystalline thin films of TiO2 doped with Tb have been investigated. Thin films were deposited on different (silicon and glass) substrates using modified magnetron sputtering method named High Energy. Structural properties were examined by X-Ray Diffraction (XRD) method. The results have shown, that phase and average crystallites size of prepared thin films were determined by the...
In this work, influence of magnetron sputtering parameters on structural properties of TiO2 thin films has been outlined. Titanium dioxide thin films were deposited on silicon substrates using reactive magnetron sputtering method. Structural properties of deposited thin films were investigated by X-ray Diffraction (XRD), while diversification of surface topography was examined using Atomic Force Microscopy...
SiC nanocrystals growth through the surface reaction between spin-on C60 dissolved in Carbon Disulphide (CS2) and Si substrate and 800degC (100 rains.) annealed has been investigated. Scanning Electron and Atomic Force Microscopy showed the crests of C60 clusters formed preferentially on the Si substrate steps with 40-60 nm cluster sizes. Silicon carbide nanocrystallite formation after anneal. has...
This paper attempts to clarify the link between microstructure of hydrogenated microcrystalline silicon (/spl mu/c-Si:H) and layer transport properties as well as electrical performances of solar cells. Analysis of a series of layers shows that coplanar transport properties in /spl mu/c-Si:H (as evaluated by /spl sigma//sub dark/, /spl sigma//sub photo/ and L/sub amb/) relate to the size of nanocrystal...
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