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Owing to the long lifetime and high reliability of light-emitting diode (LED) packages, few or any failures should occur during a short-term or accelerated life test. Therefore, a timeand cost-effective qualification test for accurately predicting the long-term lifetime of an LED package is a critical economic and business requirement for adoption of new LEDs. Previous research usually applied offline...
Key difference between high-power semiconductor and low-power semiconductor is self heating during operation. Self heating leads to extreme thermal change in semiconductor. Especially, regenerative energy applications tend to repeated intermittent operation. Thermal change leads to mechanical stress by CTE(Coefficient of Thermal Expansion) mismatch between substrate, bonding material(solder), bonding...
In order to predict the reliability of the product with high reliability and long life, the accelerated degradation test (ADT) is commonly applied. However, in the studies of optimizing the ADT plans, there is nearly no researches on how to select the test stress levels. In this paper, the drift Brownian motion is selected as the degradation model. The optimization of the selection of the stress levels...
Life prediction is one of the newly arisen key technology for promoting the reliability and quality of electronic products. But, the effect of the prevalent life prediction methods is not satisfactory; most of them are on the stage of theoretical research and lack of engineering practicability. In this paper, a methodology of life prediction based on accelerated degradation testing is introduced....
Since the very beginning of the flash memory era, the market has been dominated by the floating gate technology. However, as floating gate flash continues along a very steep scaling path, more and more barriers start to appear, limiting further scaling possibilities of the technology. At the same time, other concepts are preparing to take over. This paper concentrates on the prospect of high-k materials...
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