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We propose a built-in scheme for generating all patterns of a given deterministic test set T. The scheme is based on grouping the columns of T, so that in each group of columns the number ri of unique representatives (row subvectors) as well as their product R over all such groups is kept at a minimum. The representatives of each group (segment) are then generated by a small finite state machine (FSM)...
Soft errors caused by ionizing radiation have emerged as a major concern for current generation of CMOS technologies and the trend is expected to get worse. Soft error rate (SER) measurement, expressed as number of failures encountered per billion hours of device operation, is time consuming and involves significant test cost. The cost stems from having to connect a device-under-test to a tester for...
In this paper, we present an automatic soft IP (Intellectual Property) generation method for high-speed Viterbi decoders. In our scheme, the synthesizable HDL (Hardware Description Language) code for the Viterbi decoder is automatically produced depending on not only the system parameters such as a coding rate but also the hardware architecture for parallel processing. The proposed method is implemented...
This paper investigates the concurrent detection of multiple-bit errors in polynomial basis (PB) multipliers over binary extension fields. To this end, multiple parity bits are considered for both inputs of the multiplier. For the multiplier architecture considered here, the two inputs go through considerably different sets of circuits and this allows us to use different number of parity bits with...
We show that the permutation group membership problem can be solved in depth (logn)3 on a Monte Carlo Boolean circuit of polynomial size in the restricted case in which the group is abelian. We also show that this restricted problem is NC1-hard for NSPACE(logn).
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