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Testing of high-speed Digital-to-Analog Converters (DACs) is a challenging task, as it requires large number of high-speed synchronized input signals with specific test patterns. To overcome this problem, we propose use of PRBS signals with an “Alternate-Bit-Tapping” technique and eye-diagram measurement as a solution to efficiently generate the test-vectors and test the DACs. This approach covers...
Design and testing of analog and mixed-signal (AMS) circuits is often regarded as representing significant bottlenecks in system-on-chip (SOC) design. Testing the analog and mixed-signal circuitry of a mixed-signal IC has become a difficult task. This is due to the fact that most analog and mixed signal circuits are tested by its functionality, which is both time consuming and expensive. Hence the...
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