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This paper focuses on evaluating the adhesive strength of silver-tin (Ag-Sn) solder-jointed single-crystal silicon (SCS) specimens. The exothermic reaction in aluminum-nickel (Al/Ni) multilayer film was used as a heat source for melting the solder film. The reaction generated heat enough to melt Ag-Sn film. To measure the adhesive strength of solder-jointed SCS specimens, we developed the four-point...
The objective of this paper is to investigate thin, solid, prestressed ceramic films as a means of enhancing the reliability of silicon semiconductor wafers stressed in bending. To characterize the effect of thin films on strength, one-micrometer ceramic films were deposited on wafers using plasma-enhanced chemical-vapor deposition. The modulus of rupture (MOR) of the coated wafers was determined...
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