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In-band OSNR measurement for CO-OFDM systems using high-resolution spectral analysis is experimentally demonstrated. It is shown that signal and noise levels can be monitored by direct optical spectrum analysis, avoiding the need for data demodulation.
Optical performance monitoring (OPM) is desired for future smart optical networks. 2-D phase portrait contains fruitful waveform information, which can be a valuable tool for OPM. In this paper, we review the generation of 2-D phase portrait by our cost-effective single-channel sampling technique, and its applications for OSNR and dispersion monitoring in different systems.
In-band OSNR measurement for IM/DD O-OFDM systems using high-resolution spectral analysis is experimentally demonstrated. It is shown that noise level can be monitored by direct optical spectrum analysis using no polarization analysis or coherence properties and avoiding the need for data demodulation.
We report all-optical in-band OSNR monitoring at 160 Gb/s via slow-light enhanced third harmonic generation in a 2D silicon photonic crystal waveguide, achieving better performance than quadratic methods.
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