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Modern technology applications are constantly demanding ultra low power integrated circuit (IC) design. The testing of these low-power devices are considered as one of the most important challenge in semiconductor industry [2, 3, 4, 5]. This paper provides a path timing based design with test (DWT) approach for limiting the power during test capture phase. The motive is to introduce some sort of logic...
Scan-based manufacturing test of low power designs often exceeds the very tight functional constraints on average and instantaneous logic switching. The logic activity during the shift and launch-capture of test pattern data may lead to excessive power consumption and voltage droop. This paper focuses on the management of instantaneous power during the capture phase. By taking advantage of the existing...
This paper describes the challenges of testing low-power designs that use the commonly used multi-supply multi-voltage (MSMV) and power shut-off (PSO) design methodology. We describe a novel solution to address the manufacturing test of an MSMV/PSO design by using power-mode specifications to map multiple power modes to their target test modes and enhancing the DFT and ATPG methodology to enable a...
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