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IEEE Electron Device Letters > 2015 > 36 > 5 > 430 - 432
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 1 > 78 - 85
2008 IEEE Custom Integrated Circuits Conference > 121 - 124
IEEE Electron Device Letters > 2015 > 36 > 5 > 430 - 432
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 1 > 78 - 85
2008 IEEE Custom Integrated Circuits Conference > 121 - 124