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This paper identifies three distinct types of losses associated with high dielectric materials in a rf electric field, specifically in a rectangular TE102 microwave cavity. Various orientations of high dielectric structures relative to the electric field polarization have been studied using ansoft high frequency structure simulator (HFSS) (version 9.0, Pittsburgh, PA) and Computer Simulation Technology...
Substrate bias-sputtered FeTaN/SiO2 multilayer films with a doublelayer structure were prepared from electrically insulated thick FeTaN layers. These were built up of thin FeTaN layers with alternating anisotropy direction. Such films, hereafter referred to as "Double-Structured substrate Bias-sputtered Multilayer" (DSBM) films, were developed for potential application in magnetic heads...
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