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Due to the continuous shrinking of the transistor sizes which is strongly driven by Moore's law, reliability becomes a dominant design challenge for embedded systems. Reliability problems arise from permanent errors due to manufacturing, process variations, aging as well as soft errors. As a result, the hardware will consist of unreliable components and hence, the development of embedded systems has...
In this paper we focus on the modelling and architecture exploration of Schneider Electric protection devices at the Cycle Accurate Bit Accurate (CABA) level. The goal is to find the best hardware/software partitioning and improve the tests coverage rate in order to increase the robustness and fault-tolerance of this class of safety devices. This approach is applied on a medium voltage protection...
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