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We present a novel trigonometry-based probability calculation (TPC) method for analyzing circuit behavior and reliability in the presence of errors that occur with extremely low probability. Signal and error probabilities are represented by trigonometric functions controlled by their corresponding angles. By combining trigonometric identities and Taylor expansions, the effect of an error at a particular...
Markov chains with Labelled Transitions can be used to generate test cases in a model-based approach. These test cases are generated by random walks on the model according to probabilities associated with transitions. When these probabilities correspond to a usage profile, reliability may be estimated. However, in early stages of development, such probabilities are not easy to determine, thus default...
Reliability is a crucial issue in nanoscale devices including both CMOS (beyond 22 nm) and non-CMOS. Devices in this regime tend to be more prone to errors due to thermal effects creating uncertainty in device characteristics. The transient nature of these errors commands the need for a probabilistic model that can represent the inherent circuit logic and can measure the errors. In sequential logic...
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