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2010 East-West Design&Test Symposium (EWDTS) > 242 - 245
IEEE Transactions on Nuclear Science > 2008 > 55 > 2 > 695 - 702
IEEE Journal of Solid-State Circuits > 2007 > 42 > 11 > 2492 - 2502
2010 East-West Design&Test Symposium (EWDTS) > 242 - 245
IEEE Transactions on Nuclear Science > 2008 > 55 > 2 > 695 - 702
IEEE Journal of Solid-State Circuits > 2007 > 42 > 11 > 2492 - 2502