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The research on product lifetime distribution is an important basis for assessing and improving product reliability level. The accelerated life test on nonmetallic gaskets was carried out and the failure data were obtained. After analyzing and processing these data by using the methods of least square procedure and K-S hypothesis testing, the lifetime of these gaskets was found to obey the Weibull...
This paper presents a reliability growth simulation test bed that is useful in examining the reliability growth of complex systems. It has many potential applications, including cost vs. reliability growth analyses and reliability growth program planning. The most significant application of the simulation though, is that it provides a method for examining the robustness of existing reliability growth...
Failure modes effects and criticality analysis (FMECA) is a tool that fosters proactive thinking and action. Most process FMECAs (PFMECAs) are performed by teams to develop subjective conclusions with multiple viewpoints. When different teams evaluate different processes, the results may vary widely, due to differences in persons, processes, and criteria. Yet, one of the key features of FMECAs is...
This paper illustrates how a Bayesian reliability demonstration test (BRDT) approach can be, and sometimes must be, integrated into a Design for Reliability (DFR) process. A simplified and effective BRDT algorithm is given, based on the prior distribution characteristics of reliability in the DFR process. The BRDT can significantly reduce sample size in reliability demonstration test, and serve as...
Testing and diagnosis techniques play a key role in the advance of semiconductor memory technologies. The challenge of failure detection has attracted investigation on efficient testing and diagnosis algorithm for better fault coverage and diagnostic resolution. March algorithms are widely used in SRAM testing to detect and diagnose SRAM fault model since they are relatively simple and yet providing...
We present a generic method for analyzing the effect of process variability in nanoscale circuits. The proposed framework uses kernel and a generic tail probability estimator to eliminate the need for a-priori density choice for the nature of circuit variation. This allows capturing the true nature of the circuit variation from a few random samples of its observed responses. The data-driven, non-parametric,...
In this paper we present a Bayes inference model for a simple step-stress accelerated life test (SSALT) using type-II censored samples. We assume that the failure times at each stress are exponentially distributed with a mean that is a log-linear function of the natural stress level, and derive a likelihood function for the SSALT model under type-II censoring. We integrate the engineering knowledge...
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