The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Alternate RF testing is a very promising candidate for replacing the costly standard specification-based approach. The defect filter in the alternate test flow is a crucial preparatory step for the overall success of alternate test. In this paper, we present a novel nonlinear defect filter based on an estimate of the joint probability density function of the alternate measurements. The construction...
In this paper, two improved methods are presented extending our previous work. The first one improves the results by adjusting the voltage levels of the input pulse wave stimulus. Compared with the sine wave input stimulus, the four-level pulse wave can detect even more faulty cases with the offset faults. The second one improves the results by calculating the similarity of the output spectra between...
Alternate RF testing is a very promising candidate for replacing the costly standard specification-based approach. The defect filter in the alternate test flow is a crucial preparatory step for the overall success of alternate test. In this paper, we present a novel nonlinear defect filter based on an estimate of the joint probability density function of the alternate measurements. The construction...
As the design complexity increases dramatically, results of functional simulation are usually checked through only a part of signals during design verification. It is important, therefore, to consider the observability of internal signals for effective checking. This paper proposes a static observability analysis method to automatically select internal observation signals, which improves the quality...
In many high-speed parts of chips, latch-based circuits are used to enable time borrowing, where a block may take longer time than its nominal delay to complete its computation. This enables such circuits to attain high performance and yield. In [1] and [2], we focused on maximizing path delay fault coverage and proposed the first structural delay testing approach and the associated design-for-testability...
This paper proposes a precise metric of the occurrence of gate logical faults due to manufacturing inaccuracy of the weight and threshold values in threshold logic gates for effective and efficient testing. Based on probability density functions of the values of the manufactured weights and threshold, the probability of gate logical fault occurrence is calculated and used as the metric. The metric...
This paper discusses a test generation method to derive high quality transition tests for combinational circuits. It is known that, for a transition fault, a test set which propagates the errors (late transitions) to all the primary outputs reachable from the fault site can enhance the detectability of unmodeled defects. In this paper, to generate a minimum test set that meets the above property,...
During volume testing, test application time, test data volume and high performance automatic test equipment (ATE) are the major cost factors. Embedded testing including built-in self-test (BIST) and multi-site testing are quite effective cost reduction techniques which may make diagnosis more complex. This paper presents a test response compaction scheme and a corresponding diagnosis algorithm which...
An electrical fault-waveform regenerator (EFWG) is proposed in this paper originally, including its hardware structure and software flow chart. And the EFWG is mainly relying on a power amplifier (PA) to regenerate the electrical fault waveforms recorded by fault recorders (FR), so a digital closed-loop modification technique (DCLMT), which is distinct from the predistortion technique (PDT) widely...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.