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This paper presents a nonscan design-for-testability (DFT) method for register-transfer-level (RTL) circuits. We first introduce the notation to analyze the test generation complexity, as well as two classes of sequential circuits, namely: 1) the combinationallytestable class and 2) the acyclicallytestable class. Then, we introduce a new class of linear-depthtime-bounded circuits as one of the...
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