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IEEE Electron Device Letters > 2014 > 35 > 5 > 518 - 520
2011 International Reliability Physics Symposium > 5A.4.1 - 5A.4.5
IEEE Electron Device Letters > 2014 > 35 > 5 > 518 - 520
2011 International Reliability Physics Symposium > 5A.4.1 - 5A.4.5