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This paper presents a 44.2-mW 3.2-GHz 3-port register file (RF) that demonstrates measured operation from 1.2 V down to 0.4 V. The 32-entry$\times \,32$ -bit/word 2-read/1-write RF is fabricated in TSMC 65-nm low-power low threshold voltage (low-$\text {V}_{\mathrm {t}}$ ) CMOS process. A four-transistor read port is presented that permits the design of low-capacitance dynamic local bitlines (LBLs)...
This paper introduces a novel synchronous to asynchronous logic conversion tool targeted specifically for a synchronous field programmable gate array (FPGA). This tool augments the synchronous FPGA design flow and removes the clock network to implement an asynchronous control network in its place. We evaluate the timing performance benefits of the methods used to implement the asynchronous control...
Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient errors during system operation are no longer restricted to memories but also affect random logic, and a robust design becomes mandatory to ensure a reliable system operation. Self-checking circuits rely on redundancy to detect...
The implementation of complex functionality in low-power nano-CMOS technologies leads to enhance susceptibility to parametric disturbances (environmental, and operation-dependent). The purpose of this paper is to present recent improvements on a methodology to exploit power-supply voltage and temperature variations in order to produce fault-tolerant structural solutions. First, the proposed methodology...
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