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Scan-based test methodology is used to resolve the sequential-test problem but suffers from high power dissipation. In this paper, we propose a scheme to prevent transitions of scan chain from reflecting into the circuit line. It not only can save 23% power consumption without performance loss, but also can be easily implemented with popular industrial design tools.
The network-on-chip (NoC) paradigm has emerged as a promising solution for providing connectivity among the increasing number of cores that get integrated into both systems-on chip (SoC) and chip multiprocessors (CMP). In future high performance CMPs, however, the high bandwidth requirements will not be adequately provided by electronic NoCs without dissipating large amounts of power. Previously,...
3D contactless technology based on capacitive coupling represents a promising solution for high-speed and low power signaling in vertically integrated chips. AC coupled interconnects do not suffer from mechanical stress, and the parasitic load is much reduced when compared to standard DC solutions, such as wire bonding and micro bumps. Communication system based on wireless interconnection scheme...
Multi-core SoC created great opportunities to increase overall system performance while keeping the power in check but also created many design challenges that designers must now overcome. The challenge of doubling performance every two years used to drive superscalar design with more functional units running concurrently or deeper pipeline racing for highest frequency at the cost of higher power...
This paper describes a methodology for building a reliable internet core router that considers the vulnerability of its electronic components to single event upset (SEU). It begins with a set of meaningful system level metrics that can be related to product reliability requirements. A specification is then defined that can be effectively used during the system architecture, silicon and software design...
The conventional wisdom that the SiC JFET is a normally on device has recently been superseded by the first practical normally off SiC JFET. The new true enhancement mode, three-terminal, pure-SiC design provides designers with a normally off solution that retains all the benefits of the normally on SiC JFET. With a simple change in the series gate impedance, the EM SiC JFET can be used with common...
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