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IEEE Transactions on Cybernetics > 2017 > 47 > 12 > 4392 - 4404
IEEE Transactions on Reliability > 2017 > 66 > 3 > 751 - 760
IEEE Embedded Systems Letters > 2017 > 9 > 3 > 89 - 92
IEEE Transactions on Cybernetics > 2017 > 47 > 12 > 4392 - 4404
IEEE Transactions on Reliability > 2017 > 66 > 3 > 751 - 760
IEEE Embedded Systems Letters > 2017 > 9 > 3 > 89 - 92