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IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2018 > 26 > 1 > 133 - 142
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 8 > 2143 - 2147
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 7 > 2183 - 2187
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 7 > 1789 - 1797
IEEE Photonics Journal > 2017 > 9 > 3 > 1 - 15
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 5 > 855 - 868
IEEE Journal of Solid-State Circuits > 2017 > 52 > 5 > 1210 - 1220
IEEE Transactions on Electromagnetic Compatibility > 2017 > 59 > 1 > 34 - 42
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 1 > 191 - 193
IEEE Journal of Solid-State Circuits > 2017 > 52 > 1 > 185 - 197
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control > 2016 > 63 > 12 > 2231 - 2236
IEEE Transactions on Instrumentation and Measurement > 2016 > 65 > 10 > 2389 - 2393
IEEE Electron Device Letters > 2016 > 37 > 10 > 1314 - 1317
IEEE Sensors Journal > 2016 > 16 > 18 > 6931 - 6938
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control > 2016 > 63 > 7 > 961 - 969
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control > 2016 > 63 > 7 > 986 - 992
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control > 2016 > 63 > 7 > 981 - 985
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 5 > 1975 - 1983
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control > 2016 > 63 > 4 > 575 - 581
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control > 2016 > 63 > 4 > 520 - 530